9031 Measuring or Checking Instruments, Appliances and Machines not Elsewhere Specified in Chapter 90, Profile Projectors

9031 (01/1988-..) Measuring or Checking Instruments, Appliances and Machines not Elsewhere Specified in Chapter 90, Profile Projectors 90311000 (01/1988-..) Machines for Balancing Mechanical Parts 90312000 (01/1988-..) Test Benches for Motors, Generators, Pumps, Etc. 90313000 (01/1988-12/2006) Profile Projectors 90314000 (01/1988-12/1994) Optical Instruments, Appliances and Machines for Measuring or Checking, not Elsewhere Specified in Chapter 90 90314010 (01/1995-12/1995) Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices 90314020 (01/1995-12/1995) Optical Instruments and Appliances for Inspecting Photomasks for Semiconductor Devices 90314030 (01/1995-12/1995) Optical Instruments and Appliances for Measuring Surface Particulate Contamination on Semiconductor Wafers 90314090 (01/1995-12/1995) Optical Instruments and Appliances for Measuring or Checking, not Specified or Included Elsewhere in Chapter 90 90314100 (01/1996-..) Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices 90314900 (01/1999-12/2006) Optical Instruments, Appliances and Machines for Measuring or Checking, not Elsewhere Specified or Included in Chapter 90 90314910 (01/2007-..) Profile Projectors 90314990 (01/2007-..) Optical Instruments, Appliances and Machines for Measuring or Checking, not Elsewhere Specified or Included in Chapter 90 90318010 (01/1988-12/2005) Instruments, Appliances and Machines for Measuring or Checking, not Elsewhere Specified in Chapter 90, for Civil Aircraft (Excl. Optical) 90318020 (01/2017-..) Instruments, Appliances and Machines for Measuring or Checking Geometrical Quantities, N.e.s. in ch 90 90318031 (01/1988-12/1997) Electronic Instruments, Apparatus and Machines for Measuring or Checking Geometrical Quantities 90318032 (01/1998-12/2016) Electronic Instruments, Apparatus and Machines for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices 90318034 (01/1998-12/2016) Electronic Instruments, Apparatus and Machines for Measuring or Checking Geometrical Quantities (Excl. for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices) 90318038 (01/2006-12/2016) Electronic Instruments, Apparatus and Machines for Measuring or Checking, N.e.s. in Chapter 90 90318039 (01/1988-12/2005) Electronic Instruments, Apparatus and Machines for Measuring or Checking, not Elsewhere Specified in Chapter 90 90318051 (01/1991-12/1996) Non-electronic Gauges (Excl. for Civil Aircraft) 90318059 (01/1991-12/1996) Instruments, Apparatus and Machines, for Measuring or Checking, (not Specified or Included Elsewhere in This Chapter) Non-electronic, for Measuring or Checking Geometrical Quantities, (Excl. for Civil Aircraft and Gauges) 90318080 (01/2017-..) Non-optical Instruments, Appliances and Machines for Measuring or Checking, N.e.s. in ch 90 90318091 (01/1997-12/2016) Instruments, Appliances and Machines for Measuring or Checking Geometrical Quantities, Non-optical, Non-electronic (Excl. Hand-held Instruments for Measuring Length) 90318098 (01/2006-12/2016) Non-electronic and Non-optical Instruments, Apparatus and Machines for Measuring or Checking, N.e.s. in Chapter 90 90318099 (01/1988-12/2005) Non-electronic and Non-optical Instruments, Apparatus and Machines for Measuring or Checking, not Elsewhere Specified in Chapter 90 90319000 (01/2017-..) Parts and Accessories for Instruments, Appliances and Machines for Measuring and Checking, N.e.s. 90319010 (01/1988-12/2005) Parts and Accessories for Instruments, Appliances and Machines of Subheading 9031.80, for Civil Aircraft, N.e.s. 90319020 (01/1998-12/2016) Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on SemiconDuctor Wafers, N.e.s. 90319030 (01/1998-12/2016) Parts and Accessories for Electronic Instruments, Apparatus and Machines for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices, N.e.s. 90319080 (01/1998-12/2005) Parts and Accessories for Instruments, Appliances and Machines for Measuring and Checking, N.e.s. 90319085 (01/2007-12/2016) Parts and Accessories for Instruments, Appliances and Machines for Measuring and Checking, N.e.s. 90319090 (01/1988-12/1997) Parts and Accessories for Instruments, Appliances and Machines for Measuring and Checking, N.e.s. (Excl. for Civil Aircraft)